Test: High-Speed Circuit Test Guide

Test: High-Speed Circuit Test Guide
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Description

This High-Speed Test Guide is primarily intended to introduce basic RF/Microwave measurements and provide reference for further study for RF/microwave designers who wish to test their circuits or make their circuits testable. Specific test configurations for the characterization of the linear and nonlinear behaviour of RF and microwave amplifiers are described for several measurements of interest including basic S-parameter measurements swept amplifier compression third-order intercept (TOI) and noise figure along with descriptions of the test equipment and components involved the rationale behind choosing particular components as well as common sources of error. It is recommended that you learn why each component is used in a setup and then design the setup or fine tune the representative setups we have shown to suit your application and desired accuracy. There is also a section providing references on performing mixer characterization and another section which gives some brief and basic procedures and tips on VCO characterization with additional references.


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