Application Note: Laser Diode Testing: L-I-V Curves
Access Requirements
Introduction to L-I-V laser diode testing available at the APSL at Queen’s University in Kingston, Ontario
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Product Details
Description
Product Description
Prepared by Patricia Greig, Photonics Lab Engineer, CMC Microsystems.
This application note is an introduction to L-I-V laser diode testing available at the Advanced Photonics Systems Lab (APSL) at Queen’s University in Kingston, Ontario. The techniques, supplies and basic equipment discussed here are universally applicable whether you have purchased your device from a commercial supplier, or have designed your own device and had it fabricated.
All CMC Microsystem account holders with a Prototyping or Designer Subscription are authorized to access this application note. For more information contact Linda Dougherty at licensing@cmc.ca or 613-530-4787.
Support
Support Information
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| Version: | 1.0 |
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| Status: | Released |
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| Introduction Date: | March 31, 2009 |
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| Last Updated: | January 28, 2011 |
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| Support Level: | Supported |
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| Delivery Method: | CMC Download |
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| Client Access: | CMC Download |
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