User Guide: Photonic Chip on Carrier Test Stage (ICI-224)
Description of carrier test stage and typical stage probing configurations
Minimum Subscription Required:
This document is intended primarily for photonic device designers, fabricators, and testers who wish to test their devices at the COC level, and require a mechanical stage for the test. It provides a description of the stage as well as typical stage probing configurations.
All CMC Microsystem account holders with a Prototyping or Designer Subscription can access this product. For more information contact Linda Dougherty at email@example.com or 613-530-4787.
|Introduction Date:||July 16, 2010|
|Last Updated:||November 7, 2017|
|Delivery Method:||CMC Download|
|Client Access:||CMC Download|