User Guide: Teradyne FLEX Tester MEMS Daughter Card (ICI-253)

Access Requirements

This document introduces the MEMS Daughter Card for the FLEX tester at the Advanced Mixed-Signal Systems Lab (AMSSL).

User Guide: Teradyne FLEX Tester MEMS Daughter Card (ICI-253)

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Product Details

Description

Product Description

Prepared by Dong (Hudson) An, Mixed-Signal Collaboratory Engineer, CMC Microsystems.

 

This document is the user guide to the MEMS Daughter Card for the Teradyne FLEX tester at the Advanced Mixed-Signal Systems Lab (AMSSL). The MEMS Daughter Card is a generic fixture that interfaces the device-under-test (DUT) to the tester. It is developed for quick prototyping and proof of concept work for microelectronic devices and microsystems, and is specifically optimized for MEMS devices. It provides great configuration flexibility by employing the UBS-100 breadboard socket, and is compatible with standard packages DIP48 and PGA96 that are commonly used as MEMS packaging options. Additional high voltage is also a possibility because it has twelve BNC connectors, which can be routed onto external equipment.

 

All CMC account holders with a Prototyping or Designer Subscription are authorized to access this product. For more information contact Linda Dougherty at licensing@cmc.ca or 613-530-4787. 

Support

Support Information
Product Specialist:
Version:1.0
Status:Released
Introduction Date:September 27, 2010
Last Updated:November 7, 2017
Support Level:Supported
Delivery Method:CMC Download
Client Access:CMC Download