User Guide: Teradyne FLEX Tester MEMS Daughter Card (ICI-253)
This document introduces the MEMS Daughter Card for the FLEX tester at the Advanced Mixed-Signal Systems Lab (AMSSL).
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Prepared by Dong (Hudson) An, Mixed-Signal Collaboratory Engineer, CMC Microsystems.
This document is the user guide to the MEMS Daughter Card for the Teradyne FLEX tester at the Advanced Mixed-Signal Systems Lab (AMSSL). The MEMS Daughter Card is a generic fixture that interfaces the device-under-test (DUT) to the tester. It is developed for quick prototyping and proof of concept work for microelectronic devices and microsystems, and is specifically optimized for MEMS devices. It provides great configuration flexibility by employing the UBS-100 breadboard socket, and is compatible with standard packages DIP48 and PGA96 that are commonly used as MEMS packaging options. Additional high voltage is also a possibility because it has twelve BNC connectors, which can be routed onto external equipment.
All CMC account holders with a Prototyping or Designer Subscription are authorized to access this product. For more information contact Linda Dougherty at email@example.com or 613-530-4787.
|Introduction Date:||September 27, 2010|
|Last Updated:||November 7, 2017|
|Delivery Method:||CMC Download|
|Client Access:||CMC Download|