User Guide: Test Procedure for De-embedding Fixture Effects (ICI-178)

Access Requirements

Introduction on the process of de-embedding fixture effects or other parasitic effects that cannot otherwise be removed from the Device-Under-Test (DUT) during measurement

User Guide: Test Procedure for De-embedding Fixture Effects (ICI-178)

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Product Details

Description

Product Description

This user guide introduces the process of de-embedding fixture effects or other parasitic effects that cannot otherwise be removed from the Device-Under-Test (DUT) during measurement. It focuses is on RF integrated circuits, where connectors are required to test the device (which cannot be measured directly).

 

All CMC Microsystem account holders with a Designer or Prototyping Subscription are authorized to access this technology. Contact Linda Dougherty at licensing@cmc.ca or 613-530-4787.

Support

Support Information
Product Specialist:
Version:1.2
Status:Released
Introduction Date:December 31, 2010
Last Updated:November 7, 2017
Support Level:Supported
Delivery Method:CMC Download
Client Access:CMC Download