Application Note: LabVIEW Controlled Digital Microfluidic Platform with MIP

Application Note: LabVIEW Controlled Digital Microfluidic Platform with MIP
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Description

Prepared by Derek Pyne, MASc candidate under the supervision of Dr. Yu Sun, Department of Mechanical and Industrial Engineering, Advanced Micro and Nanosystems Lab, University of Toronto, in co-operation with CMC Microsystems.

This application note describes a LabVIEW controlled platform used with MIP (delivered through the emSYSCAN project) to control digital microfluidic devices. This application note demonstrates the suitability of a MIP system combined with customized devices and instruments to carry out microfluidics system-prototyping and verification. Following this application as an example, MIP microfluidics users may build their customized components which are interfaced with MIP instruments for their research projects and applications.

Licensing Requirements or Restrictions

All CMC Microsystem account holders with a Professor Research Subscription are authorized to access this application note. For more information, contact licensing@cmc.ca or 613-530-4787.

Acknowledging CMC

If your research benefits from products and services provided by CMC Microsystems, please acknowledge this support in any publications about your work. For more information, please visit Acknowledge CMC.