MEMS Test Application Notes

Name Summary
Application Note: Implementation of Stroboscopic Illumination Test System for Monitoring and Analysis of Planar Movement of MEMS Actuators Description of an image acquisition system used to monitor and analyze high speed planar movement of microscopic structures such as microelectromechanical systems (MEMS) devices
Application Note: Developing a Pressure Sensor Test Platform with Pressure Changing at High Frequency Description of the development of a pressure sensor test platform