Application Note: Setting up AeroTech ARMS-200 and Soloist HLe
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This note describes the setup required to operate the AeroTech ARMS200 Rotary Motion Simulator and Soloist-HLe controller.
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Application Note: Temperature Imaging of Small Objects with Keysight U5855A TrueIR Thermal Imager
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This application note demonstrates how a Keysight U5855A TrueIR Thermal Imager can be used to characterize electromagnetic modes within aqueous dielectric objects.
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Application Note: Connecting LabVIEW to an Agilent Spectrum Analyzer and Configuring the Setup for Automated Measurement
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This application note describes the general steps to build an automated test setup using LabVIEW. LabVIEW is one of the best options for instrument control.
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Application Note: Specifying Probes and Probe Cards for Microelectronic and Opto-electronic Testing of Integrated Circiuts
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An application note that is a reference for subscribers embarking upon chip testing, using a simple method for specifying a probe, wedge probe or probe card per manufacturer's requirements.
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Application Note: Noise Figure Measurement at Millimeter Wave Range of Frequency
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This application note provides a general overview of noise figure measurements at mm-wave range of frequencies using a low frequency noise figure analyzer and a downconverting harmonic mixer.
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Application Note: On-Wafer Measurement at mm-Wave Range of Frequency
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Vector Network Analyzer characterization of active devices at mm-wave frequencies. These bands are beyond the baseband range of measurement equipment and require the use of up- and down-converting source extension modules.
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Application Note: Using MATLAB for Automated Measurement Setups
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This application note describes the general steps to build an automated test setup using MATLAB. MATLAB is one of the best options for post-processing of measured data.
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Application Note: Extracting Models of a Capacitive or Inductive Discontinuity on Transmission Lines Using Tektronix TDS8000 Oscilloscope
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This application note describes how to use the built-in functions of the Tektronix TDS8000 Digital Sampling Oscilloscope to extract approximate models of capacitive or inductive discontinuities on a transmission line.
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Application Note: Bit Error Rate Testing of an Optical Receiver Using the Centellax TG1B1-A
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Overview of the principals of bit error rate testing and describes an example of a test tool available through the CMC lending pool for bit error rate testing in a representative microsystems application
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Application Note: Using MATLAB to Generate Pattern Files for Mixed-Signal and Digital Tests on Teradyne FLEX Tester
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This application note describes the procedures to generate pattern files using MATLAB software for mixed-signal and digital tests on the Teradyne FLEX tester.
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Application Note: Using Kelvin Connection to Avoid Test Errors on Teradyne FLEX Tester
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The concept of the Kelvin Connection and its use to avoid test errors on Teradyne FLEX tester caused by parasitic resistance inherent in printed circuit board (PCB) traces
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Application Note: Allegro Design Flow Integration in Device Under Test Board Design
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A method of modeling and verifying the performance of high-speed electrical traces on a printed circuit board (PCB) used as a test interface to a digital microelectronic device
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Application Note: Defining and Generating Arbitrary Waveforms Using Fluke 294 Arbitrary Waveform Generator
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Description of using software to generate desired waveforms
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Application Note: How to Migrate HDL Design to ATE Test Plan Quickly and Efficiently - the V93K_TestGenerator Tool
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Description of migrating HDL design to ATE test plan using V93K_TestGenerator tool.
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Application Note: Measuring DC-Gain of an Open-Loop Amplifier
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A test setup to measure the DC-gain of an open-loop amplifier
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Application Note: Generating and Digitizing M-PSK and M-QAM Waveforms Using Verigy 93000 Automatic Test Equipment
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Description of using Verigy 93000 (93K) SOC Series Tester to perform baseband integrated circuit testing
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Application Note: DSP-Based Multi-Tone Testing for a Sampled Analog Channel
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Demonstration of using automated-test-equipment (ATE) to perform DSP-based test for mixed-signal microelectronic circuits or microsystems
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