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Application Note: Estimating Gain Spectrum in Multi-Quantum-well Fabry-Pérot Laser Diodes below Threshold
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The application note describes the procedure for obtaining the material gain spectrum of Fabry Pérot (FP) semiconductor lasers.
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Application Note: Bit Error Rate Testing of an Optical Receiver Using the Centellax TG1B1-A
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Overview of the principals of bit error rate testing and describes an example of a test tool available through the CMC lending pool for bit error rate testing in a representative microsystems application
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Application Note: Flow Injection Analysis System for Use in Spectroscopic Characterization of Photonic Devices in a Microfluidic Environment
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Description of a comprehensive flow injection analysis (FIA) system used for testing and characterization of photonic biosensors in a microfluidic environment
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Application Note: Optical Spectrum Analysis: Test Equipment at Advanced Photonic Systems Lab (APSL)
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Description and comparison of different optical instruments available for use in the APSL at Queen's University
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Application Note: Characterization of a Quantum-Dash Fabry-Perot Laser for Clock Recovery Applications
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Detailed description of the experimental setup and procedures for characterizing an edge-emitting quantum-dash Fabry-Perot (QD-FP) laser for optical clock recovery applications
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Application Note: Preparing and Using the Optical Probe Arm for Vertical Optical Coupling
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The procedure for preparing and using the SUSS MicroTec optical (or, lightwave) probe arm assembly for vertical optical coupling
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Application Note: Laser Diode Testing: L-I-V Curves
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Introduction to L-I-V laser diode testing available at the APSL at Queen’s University in Kingston, Ontario
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Application Note: Specifying Probes and Probe Cards for Microelectronic and Opto-electronic Testing of Integrated Circiuts
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An application note that is a reference for subscribers embarking upon chip testing, using a simple method for specifying a probe, wedge probe or probe card per manufacturer's requirements.
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