Fab: Optoelectronic/Photonic Process Technology: III-V Epitaxy on GaAs Substrates

Description

Prototyping services on GaAs substrate supported by CMC engineer, streamline prototyping variety of structures for optoelectronics, photonics researches and applications.

CMC provides access to industrial standard foundries at subsidized rates. The foundries grow epitaxial wafers on GaAs substrates via Molecular Beam Epitaxy (MBE) and Metal-Organic Chemical Vapor Deposition (MOCVD). Custom processes applied on a case-by-case basis realizing the desired specification and functionality. In addition, metrology services are provided. Some of them are at cost recovery based.

Details on MBE epitaxy on GaAs Substrate:

  • Epitaxy: GaAs, AlGaAs, InGaAs, Diluted Nitrides and Antimonites
  • Dopant: p-type (Be), n-type (Si)
  • Substrate crystal orientation: (100) or 2 degree off (100)
  • Substrate dimension: 3” or 4” wafers, up to 3 wafers per MBE run
  • Substrate conductivity: n-type, p-type or semi-insulating 
  • Typical epitaxial structure type: Super-lattices, Multi Quantum Well (MQW), Quantum Dots, detector-like structures with low background impurity, low temperature growth, high mobility materials


Details on MOCVD epitaxy on GaAs substrate:

  • Epitaxy: GaAs, AlGaAs, InGaAs, AlInGaAs, InGaP,
  • Dopant: p-type (C or Zn), n-type (Si)
  • Substrate crystal orientation: (100) or 2 degree off (100)
  • Substrate dimension: Up to six 3” or 4” wafers per MOCVD run
  • Substrate conductivity: n-type, p-type or semi-insulating 
  • Typical epitaxial structure type: Multi Quantum Well (MQW) lasers, VCSELs, materials for researches on optical non-linearity


Epitaxy-Specific Metrology:

  • In-situ reflectance growth rate monitoring and optical pyrometry
  • Double crystal X-ray diffraction (single point)
  • Photoluminescence (PL) and reflectance (R) mapping

Cost Recovery Based Epitaxy Metrology:

  • SIMS profile
  • SEM and TEM
  • Electrochemical (Polaron) profiling
  • Surfscan™ (for defect counting and mapping)

Note: Analysis done on calibration structures and/or actual wafers

Licensing Requirements or Restrictions

Please see Help with Licensing to review licensing procedure. For more information, contact our License Administrator at licensing@cmc.ca or 613-530-4787.

Acknowledging CMC

If your research benefits from products and services provided by CMC Microsystems, please acknowledge this support in any publications about your work. For more information, please visit Acknowledge CMC.