2.1 Preparing to Test 2.1.1 Generating a Test Plan 2.1.2 Test Bench Description 2.2 Initial Functional Testing 2.3 Tips for Handling Loose Dice 2.4 ESD Protection 2.5 Wafer Probing 2.5.1 Introduction to Wafer Probing 2.5.2 Installing the Probe Head 2.5.3 Microscope Viewing 2.5.4 Probing Procedure 2.5.5 Probing Issues 2.5.6 Caution 2.5.7 What CMC Microsystems Uses 2.5.8 References
2.1 Preparing to Test
2.1.1 Generating a Test Plan 2.1.2 Test Bench Description
2.1.1 Generating a Test Plan
2.1.2 Test Bench Description
2.2 Initial Functional Testing
2.3 Tips for Handling Loose Dice
2.4 ESD Protection
2.5 Wafer Probing
2.5.1 Introduction to Wafer Probing 2.5.2 Installing the Probe Head 2.5.3 Microscope Viewing 2.5.4 Probing Procedure 2.5.5 Probing Issues 2.5.6 Caution 2.5.7 What CMC Microsystems Uses 2.5.8 References