3.4.2 References

[1] Cascade Microtech Application Note, "Layout Rules for GHz-Probing"

[2] Cascade Microtech Application Note, "Introduction to bipolar device GHz measurement techniques"

[3] IEEE BCTM Short Course "Design, Measurements, and Modelling for RF and Microwave Integrated Circuits" Sept. 1996.

[4] Cascade Microtech Application Note, "On-Wafer vector network analyzer calibration and measurements"

[5] A. Fraser, R. Gleeson, E.W. Strid, "GHz On-Silicon-Wafer Probing Calibration Methods" IEEE BCTM 1988.

[6] P.J. Van Wijnen, H.R. Claessen, E.A. Wolsheimer, "A new straightforward calibration and correction procedure for "on Wafer" high frequency S-parameter measurements (45MHz-18GHz) IEEE BCTM 1987

[7] Cascade Microtech Seminar, "Advances in Wafer Probing and Analysis"

[8] Paul J. van Wijnen, "On the Characterization and Optimization of High-Speed Silicon Bipolar Transistors", Cascade Microtech

Cascade Application Notes can be obtained from their website at: http://www.cmicro.com/news.htm

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