Cascade Microtech Application Note, "Layout Rules for GHz-Probing"
 Cascade Microtech Application Note, "Introduction to bipolar device GHz measurement techniques"
 IEEE BCTM Short Course "Design, Measurements, and Modelling for RF and Microwave Integrated Circuits" Sept. 1996.
 Cascade Microtech Application Note, "On-Wafer vector network analyzer calibration and measurements"
 A. Fraser, R. Gleeson, E.W. Strid, "GHz On-Silicon-Wafer Probing Calibration Methods" IEEE BCTM 1988.
 P.J. Van Wijnen, H.R. Claessen, E.A. Wolsheimer, "A new straightforward calibration and correction procedure for "on Wafer" high frequency S-parameter measurements (45MHz-18GHz) IEEE BCTM 1987
 Cascade Microtech Seminar, "Advances in Wafer Probing and Analysis"
 Paul J. van Wijnen, "On the Characterization and Optimization of High-Speed Silicon Bipolar Transistors", Cascade Microtech
Cascade Application Notes can be obtained from their website at: http://www.cmicro.com/news.htm
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