Here is the key to many of the abbreviations used throughout this document:
ADC |
Analog-to-Digital Converter |
AUT |
Amplifier Under Test |
CW |
Continuous Wave |
DANL |
Displayed Average Noise Level |
DSB |
Double Sideband |
DUT |
Device Under Test |
ENR |
Excess Noise Ratio |
ESD |
Electrostatic Discharge |
GSG |
Ground-Signal-Ground |
IF |
Intermediate Frequency |
IM |
Intermodulation |
IMD |
Intermodulation Distortion |
ISS |
Impedance Standard Substrate |
NA |
Network Analyzer |
NF |
Noise Figure |
NFM |
Noise Figure Meter |
RBW |
Resolution Bandwidth |
RFC |
RF Choke Inductor |
SA |
Spectrum Analyzer |
SG |
Signal Generator |
SNA |
Scalar Network Analyzer |
SNR |
Signal-to-Noise Ratio |
SOLT |
Short-Open-Load-Thru |
SSB |
Single Sideband |
TOI |
Third-Order Intercept |
TRL |
Thru-Reflect-Line |
TRM |
Thru-Reflect-Match |
VBW |
Video Bandwidth |
VNA |
Vector Network Analyzer |
VSWR |
Voltage Standing Wave Ratio |
YIG |
Yitrium Iron Garnet |
Back to Test Guide Table of Contents