The MIP generic MEMS variant bridges the gap between algorithmic/architectural exploration and stimulus, and measurement of MEMS sensors and actuators. It presents a modular, desktop environment for MEMS and electronics device integration and validation in a system context.
The MIP generic MEMS variant has a PXIe-based control system, which includes a system-level design environment, data acquisition, FPGA-based imaging system, FPGA based signal/control processing and signal conditioning, as well as MEMS sensor and actuator interfaces for MEMS micro-device characterization and measurement.
Key Platform Benefits
- Accelerates research by providing a feature-rich platform for integration and validating of MEMS-based microsystems.
- Addresses specific research needs through a graphics-based programmable environment and MEMS sensor and actuator interfaces boards.
- Enables a faster path to commercialization by sourcing commercial-grade components and through compliance with commercial standards and interfaces (e.g., PXI and PXIe).
Suitable research filed for this variant includes real-time feedback loop control (analog or video-based) of MEMS devices such as accelerometers. A research example is shown below:
Research Example of MIP Generic MEMS Variant
NI PXI Express Chassis
High-voltage amplifier and various of high-voltage fixtures, as well as interface boards and test chips
FPGA-based imaging system including color camera, microscopic lens system, motorized zoom, illuminator, FPGA video adapter, microscope stand, camera cables, FPGA camera interface software, FPGA image processing library, zoom and lighting interface device, and zoom and lighting control software.
- Technical documents:
- Technical support
- Reference designs
- User community forum