This material is open to revision and reader suggestions are welcomed. Please contact equipmentloan@cmc.ca to submit.
Copyright © CMC Microsystems 1999
Document ICI-093
Last Revised: August, 2013
Table of Contents
- Introduction
An overview of the types of tests that may be performed, and how this guide addresses the subject.
- Planning & Conducting Tests
Preparing to test, including the generation of a test plan and test bench descriptions; initial functional testing; suggestions for handling loose dice; ESD prevention; wafer-level probing
- High-Speed Measurement Techniques
- Swept Frequency Sources
- Network Analyzer Basics & S-Parameter Measurements
Network Analyzer basics; S-parameter measurements; considerations; other possible measurements; references
- Network Analyzer Calibration
Network Analyzer calibration; types and sources of measurement errors; one-port calibration (reflection measurements); full two-port calibration (reflection and transmission measurements); enhanced-response calibration; on-wafer probing calibration; calibration options and standards; verifying calibration; other effects; additional suggestions and references
- De-Embedding Pad Parasitics
De-embedding procedure; using MATLAB; using ADS; saving and formatting measurement data; references
- Device Bias Considerations
Device biasing tricks; bias tees and D.C. blocks; supplying power to the device under test; references
- Introduction to Spectrum Analyzers
Operation; understanding specification snd how this affects measurements; accuracy; resolution; sensitivity/DANL; distortion; dynamic range; calibrating a unit for absolute power measurements; references
- Power Measurements
- Using the RF Substitution Method To Determine Insertion Loss and Gain
- Nonlinear Measurements
Compression measurements; two-tone 3rd-order intercept (TOI); procedure; tricks; references
- Noise Figure Measurements
Overview; measuring using a noise figure meter; measuring using a spectrum analyser; sources of error; errors that can be eliminated or reduced; calculating measurement accuracy; references
- Mixer Test References
- VCO Measurements
- Impedance Measurements
- Automating Measurements
- Troubleshooting
- Quick Tips
- RF & Microwave Test Components
Considerations for selecting parts; connector types; adapters; tools; cables; bias tees and D.C. blocking; attenuators; filters; power splitters/combiners; termination impedances; mixers; low-noise amplifiers and preamplifiers; circulators and isolators
- Glossary
- Web Links